UiO-66, low defectivity
UiO-66, low defectivity
UiO-66 is the benchmark zirconium MOF, valued for its combination of high porosity, chemical robustness and broad tunability.
Our low-defectivity UiO-66 is developed to contain as few linker vacancy defects as possible, enhancing its stability to both harsher chemical environments and high temperatures. It also shows improved durability in multi-cycle testing.
Amount (g)
5
10
25
EUR (exl VAT)
820
1340
2900
Specifications
UiO-66, low defectivity
Zr6O4(OH)4(C6H4(COO)2)6
Metal: Zr(IV)
Linker: Terephthalate
Thermal stability: >400 °C in air.
BET surface area: 1000 – 1300 m2/g
Quality
What sets our materials apart
Every batch meets rigorous purity standards and arrives ready for testing.
Batch-to-batch reliability
Identical performance across all production runs ensures reproducible results.
Complete technical datasheets
Full characterization data supports your research from day one.
From grams to kilograms without compromise
Scaled-up MOF production with the exact same stability and purity.